Testing of Digital Systems
John Leinart and Mike Daugird
Advisor: Dr. V. Prasad
This project entailed the development of algorithms which detect faults
in combinational and sequential circuits, as well determining which chips
contain faults on a microprocessor board. Methods used to detect a fault
in combinational circuits include; boolean differences, fault dictionaries,
and path sensitization. A method used for ascertaining fault presence in
sequential circuits requires using a synchronizing sequence which guarantees
the state of a machine, and then the application of a fault detection sequence.
The exhaustive testing of an Intel 8080 microprocessor is calculated to
require ten to the power twenty years; which leads us to a method of testing
by replacement by a non-faulty processor or sending the same inputs to
a reference processor and the processor in question.
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