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Testing of Digital Systems
John Leinart and Mike Daugird
Advisor: Dr. V. Prasad

This project entailed the development of algorithms which detect faults in combinational and sequential circuits, as well determining which chips contain faults on a microprocessor board. Methods used to detect a fault in combinational circuits include; boolean differences, fault dictionaries, and path sensitization. A method used for ascertaining fault presence in sequential circuits requires using a synchronizing sequence which guarantees the state of a machine, and then the application of a fault detection sequence. The exhaustive testing of an Intel 8080 microprocessor is calculated to require ten to the power twenty years; which leads us to a method of testing by replacement by a non-faulty processor or sending the same inputs to a reference processor and the processor in question.

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